Spectroscopy

Perkin Elmer Spectrum One Fourier Transform Infrared (FTIR) spectrometer, and Spotlight Imaging FTIR microscope. We also have a Specac Golden Gate accessory, with a single reflection 45° diamond ATR.

• The ATR has diamond and germanium crystals for a wider material analysis range
• The spotlight system allows for mapping and identification of individual micro-particles with spatial resolution of 10µm

Renishaw Invia Micro Raman system fitted with a 514nm laser allows for detailed analysis of carbon as well as determining the chemical structure of many materials.

• Ideal for carbon material analysis
• Minimal sample preparation
• Non-destructive
• Linefocus mode for particle mapping
• Analyse stresses in addition to chemistry

Kore SurfaceSeer Time of Flight – Secondary Ion Mass Spectrometer (ToF-SIMS) is a state of the art spectrometer that allows for the simultaneous analysis of elements and molecular fragments of a surface. The most sensitive of all the commonly-employed surface analytical techniques, SIMS provides a unique combination of high sensitivity for atoms (from Hydrogen to Uranium), clusters of atoms and molecular fragments.

• 1-2 nanometre surface penetration
• High sensitivity
• Full atomic range
• Spatially-resolved analysis

Perkin Elmer Lambda 1050(+) provides further sample analysis capabilities of coatings, glass, solar, modern materials and components.

• 190nm – 3300nm wavelength range
• 2D 150mm integrating sphere and InGaAs detector system

The instrument is equipped with Perkin Elmer’s Color Methods Software that calculates colour indices for liquids, clear and opaque solids, enabling us to output a range of colour parameters.