A Complimentary Inspection Technique based on Computer Tomography and Plenoptic Camera for MEMS Components CITCOM
Funder: European CommissionDuration: October 2017 - September 2020
People
| Name | Telephone | Office | ||
|---|---|---|---|---|
|
Professor Tat-Hean Gan Director of Brunel Innovation Centre (Principal investigator)
T: +44 (0)1895 268920
E: tat-hean.gan@brunel.ac.uk |
+44 (0)1895 268920 | tat-hean.gan@brunel.ac.uk | Brunel Innovation Centre,Cambridge - |
Outputs
Chong, A., Feng, G., Kanfoud, J. and Gan, TH. (2018) 'An outline of a complementary inspection system for micro-electro-mechanical system (Mems) devices based on radiography and plenoptic camera'.16th International Conference on Manufacturing Research (ICMR) / 33rd National Conference on Manufacturing Research (NCMR). Univ Skovde, Skovde, SWEDEN. 1 - 13 September. IOS PRESS. pp. 33 - 38. ISSN: 2352-751X