Dr Ian Dear
Senior Lecturer

Morris, A., Maharaj, C., Kourmpetis, M., Dear, I., Puri, A. and Dear, J. (2009) 'Optical strain measurement techniques to assist in life monitoring of power plant components'. Journal of Pressure Vessel Technology, Transactions of the ASME, 131 (2). ISSN: 0094-9930

Morris, A., Kourmpetis, M., Dear, ID., Sjodahl, M. and Dear, JP. (2007) 'Optical strain monitoring techniques for life assessment of components in power generation plants'. Proceedings of the Institution of Mechanical Engineers, Part A: Journal of Power and Energy, 221 (8). pp. 1141 - 1152. ISSN: 0957-6509

Dear, ID., Dislis, CD., Ambler, AP. and Dick, J. (1994) 'Test strategy planning using economic analysis'. Journal of Electronic Testing, 5 (2-3). pp. 137 - 155. ISSN: 0923-8174

Dislis, C., Dick, JH., Dear, ID., Azu, IN. and Ambler, AP. (1993) 'Economics modeling for the determination of test strategies for complex VLSI boards'.International Test Conference 1993: Designing, Testing, and Diagnostics - Join Them. Baltimore, MD. 17 - 21 October. I E E E. pp. 210 - 217.

Dear, ID., Dislis, C., Ambler, AP. and Dick, J. (1991) 'Economic effects in design and test'. IEEE Design and Test of Computers, 8 (4). pp. 64 - 77. ISSN: 0740-7475