Zeiss Supra 35VP SEM-EDX system

At the Experimental Techniques Centre, we have a number of electron microscopes to cater for a wide variety of materials, samples and products.

A FEG SEM, this instrument is capable of obtaining higher resolution images under the right conditions and several detectors, energy-dispersive x-ray analysis (EDX), back-scattered electron detection (BSE) and electron back-scattered diffraction (EBSD). This also has the capability to perform low vacuum analysis, as well as the usual elemental determination capability.

For more information or to discuss your electron microscopy requirement, please contact our Scientific Officer Team at etc@brunel.ac.uk